GE電磁閥（通用電氣） 114A8218P034

XTDWSV2X40X10/80    172659
XTDWSVN1    172663
XTDWSVPE1    172664
XTMFAR1    174002
XTMFC4-W1000    173998
XTMFC4-W1000-SOND-RAL*    186571
XTMFC4-W800    173999
XTMFC4-W800-SOND-RAL*    186572
XTMFF-MW600    173997
XTMFF-MW600-SOND-RAL*    186570
XTMFS2    174001
XTMFS2-SOND-RAL*    186574
XTMFS4-W600    174000
XTMFS4-W600-SOND-RAL*    186573
XTMGT-BB    173989
XTMGT-MB    173990
ACV-2200,
ACV-3000,
ACV-3100
Non-contact
Resistivity
Profiling
Systems
AIR-GAP CV PROFILING
AFM Tip Scanner
AFM Objective
for optical
Microscopes
SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
SCANNING PROBE MICROSCOPY (SPM) FOR R&D
SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
AFM-1000 Atomic Force Microscope - Proberstation 1000
Atomic Force
Microscope -
Proberstation
1000
SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
SCANNING PROBE MICROSCOPY (SPM) FOR R&D
SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
AFM-2000 Atomic Force Microscope - Proberstation 2000
Atomic Force
Microscope -
Proberstation
2000
SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
SCANNING PROBE MICROSCOPY (SPM) FOR R&D
SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
CMS, CLS
CMS, CLS
SHEET RESISTANCE MEASUREMENT
COREMA-2000 Contactless Resistivity Mapping System for Semi-insulating Wafers
COREMA-2000
Contactless
Resistivity
Mapper
Resistivity measurement for semi-insulators
Closed Cycle He-Cryostats for Semilab DLS systems
Cryostats for
Semilab DLS
systems
DEEP LEVEL TRANSIENT SPECTROSCOPY
DEEP LEVEL TRANSIENT SPECTROSCOPY - PV
DLS-1000 Deep Level Transient Spectrometer
DLS-1000 Deep